DT-AI2000 is a defect inspection instrument for GaN/SiC epitaxial, Si and glass-based materials, which can detect and distinguish defects such as particles, spots, pits, scratches and stains.

It supports 4", 6" and 8" wafer inspection, and has the advantages of high inspection accuracy and high productivity.

Product main technical parameters

Shenzhen Diao Tuo Technology Co., LTD

Contact person: Mike

Email address: nanofab@diaotuotech.com

Telephone: +8619820819249

Welcome to inquire!